Product Details:
| Minimum Order Quantity | 1 Piece |
| Wavelength Range | 190-1100 nm |
| Optical System | Double Beam |
| Mobility | Benchtop |
| Spectral Bandwidth | 1 nm |
| Lamp Type | Tungsten Lamp, Deuterium Lamp |
| Shape | Square |
We also offer our clients a wide range of Thin Film Thickness System for Laboratory Work. Our products are highly appreciated by the clients. Specifications Spot Size (normal) Adjustable 0.8 mm to 1 cm Precision 0.2 nm Repeatability 0.1 nm Stage Size 200 mm x 200 mm Measurement Range 20 nm to 50 m (Thickness only), 100 nm to 10 m (Thickness w/ n & k) Features Semiconductor compounds Functional films in MEMS/MOEMS Easy to operate CCD based array detector system to ensure fast measurement