Approx. Rs 55 Lakh / PieceGet Latest PriceProduct Details:
We are the supplier of Spectroscopic Ellipsometer to all our indian clients. Our product is a highly sensitive optical measurement technique that is used to analyze thin-layer stacks. And it is based on the observation that the polarized light reflected from the surface of the thin layer is used to calculate the thickness and other optical parameters. The products are highly appreciated from the clients in various research institutions.
Highest accuracy and sensitivity
Coated thickness / Surface roughness, anisotrophy / crystalinity etc.
Surface and interface roughne
Fully integrated software package for measurement, modelling and automatic operation
Thin film thickness: 1Å to 30 µm
Large spectral range: 240 - 800nm - 2100 nm
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