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Product Details:Minimum Order Quantity | 1 Piece |
Application | Laboratory |
We are also offering wide range of Film Thickness Measuring System to our clients. Wavelength from 200 nm to 3300 nm. The products are special purpose thickness measuring systems that are used in thousands of research application in less than 3 seconds. Our products are designed to use for opaque / transparent substrate plates. Features: Semiconductor compounds Functional films in MEMS/MOEMS Thin film transistors (TFT) stack Easy to operate with Window based software with out time consuming manual spectral comparison. Uses CCD based array detector system to ensure fast measurement Specifications: Measure up to: 5 layers film thickness Conductive oxide: Indium Tin Oxide Coatings: Optical coatings TiO2, SiO2, Ta2O5
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